@inproceedings{zhang2025falcowafer,
  title={FALCO-WAFER: Feature-Aware Lightweight Contextual Detector for Wafer Defect Detection},
  author={Zhang, Haotian and Cao, Shurong and Zou, Ningmu},
  booktitle={2025 IEEE International Test Conference in Asia (ITC-Asia)},
  pages={43--47},
  year={2025},
  doi={10.1109/ITC-Asia67627.2025.00016}
}